Influence of post-deposition annealing o
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Kim, K.-J. ;Yoo, H. ;Jeong, S.-W. ;Roh, Y.
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Article
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2010
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John Wiley and Sons
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English
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## Abstract We report the roles of postβdeposition annealing of PVP/pentacene doubleβlayered films on the electrical properties of organic thin film transistors (OTFTs). Data obtained by atomic force microscopy (AFM) and Xβray diffraction (XRD) techniques demonstrate that both the grain size and th