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Study on the device characteristics of FePc and FePcCl organic thin film Schottky diodes: Influence of oxygen and post deposition annealing

✍ Scribed by K.R. Rajesh; C.S. Menon


Book ID
116670022
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
217 KB
Volume
353
Category
Article
ISSN
0022-3093

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## Abstract We report the roles of post‐deposition annealing of PVP/pentacene double‐layered films on the electrical properties of organic thin film transistors (OTFTs). Data obtained by atomic force microscopy (AFM) and X‐ray diffraction (XRD) techniques demonstrate that both the grain size and th