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Study on NiO/Fe interface with X-ray photoelectron spectroscopy

โœ Scribed by Chun Feng; Jing-yan Zhang; Jiao Teng; Fu-ming Wang


Book ID
107672906
Publisher
Springer-Verlag
Year
2010
Tongue
English
Weight
651 KB
Volume
17
Category
Article
ISSN
1674-4799

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X-ray photoelecrron spectroscopy (;xPS) las been used :O study the estemal layers of some zeolitc surfaces. It has been shown that the (SijAl) ratio of the external surf== is rou&ly twi= that of the bulk. The Ce'+ oxidation ofcerium exchansd Y zeoiite has been studied, and cerium diotide formation i