This paper describes the characterization by x-ray photoelectron spectroscopy (XPS) of several Ge-doped silica glasses before and after reactive ion etching (ME) in sulphur hexafluoride (SF,). These glasses have been commonly used in the production of optical waveguides, with varying amounts of GeO,
An X-ray photoelectron spectroscopy study on zeolites
β Scribed by J.-Fr. Tempere; D. Delafosse; J.P. Contour
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 355 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0009-2614
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β¦ Synopsis
X-ray photoelecrron spectroscopy (;xPS) las been used :O study the estemal layers of some zeolitc surfaces. It has been shown that the (SijAl) ratio of the external surf== is rou&ly twi= that of the bulk. The Ce'+ oxidation ofcerium exchansd Y zeoiite has been studied, and cerium diotide formation is detected. CeOz is located on the external surface and may generate a selective "screening effect" agzinsi the silicon atoms.
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