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Study of X-ray-induced defects in perthite crystals

✍ Scribed by G. Prasad; K. V. Rao


Publisher
Springer
Year
1991
Tongue
English
Weight
179 KB
Volume
10
Category
Article
ISSN
0261-8028

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Defect analysis in crystals using X-ray
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## Abstract A brief review of X‐ray topographyβ€”a nondestructive method for direct observation and characterization of defects in single crystalsβ€”is presented here. The origin and development of this characterization method and the different techniques derived from it are described. Emphasis is plac