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Study of thin Ge films with amorphous and nanocrystalline phases via the techniques of EXAFS spectroscopy and AFM

✍ Scribed by R. G. Valeev; A. N. Deev; D. V. Surnin; V. V. Kriventsov; O. V. Karban; V. M. Vetoshkin; O. I. Pivovarova

No coin nor oath required. For personal study only.

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