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Raman scattering spectra and electrical conductivity of thin silicon films with a mixed amorphous-nanocrystalline phase composition: Determination of the nanocrystalline volume fraction

✍ Scribed by V. G. Golubev; V. Yu. Davydov; A. V. Medvedev; A. B. Pevtsov; N. A. Feoktistov


Book ID
110118141
Publisher
SP MAIK Nauka/Interperiodica
Year
1997
Tongue
English
Weight
88 KB
Volume
39
Category
Article
ISSN
1063-7834

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