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Study of the trapping of CoFe impurities at the internal wall of nanosized Si voids

✍ Scribed by W. Deweerd; T. Barancira; G. Langouche; K. Milants; R. Moons; J. Verheyden; H. Pattyn


Book ID
114168392
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
437 KB
Volume
120
Category
Article
ISSN
0168-583X

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