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Study of the relaxation process during InGaAs/GaAs (001) growth from in situ real-time stress measurements

✍ Scribed by GonzaÌlez, M. U.; GonzaÌlez, Y.; GonzaÌlez, L.

Book ID: 120443878
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 436 KB
Volume: 81
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1524303

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