✦ LIBER ✦
In situ Real-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms
✍ Scribed by Sasaki, Takuo; Suzuki, Hidetoshi; Sai, Akihisa; Lee, Jong-Han; Takahasi, Masamitu; Fujikawa, Seiji; Arafune, Koji; Kamiya, Itaru; Ohshita, Yoshio; Yamaguchi, Masafumi
- Book ID
- 118004740
- Publisher
- Institute of Pure and Applied Physics
- Year
- 2009
- Tongue
- English
- Weight
- 635 KB
- Volume
- 2
- Category
- Article
- ISSN
- 1882-0778
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