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Study of the interaction of highly charged ions with SiO2 surface

✍ Scribed by H.B. Peng; R. Cheng; X.Y. Yang; Y.C. Han; Y.T. ZHAO; J. Yang; S.W. Wang; Y. Fang; T.S. Wang

Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
292 KB
Volume
203
Category
Article
ISSN
0257-8972

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