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Study of the cracking of highly porous p+ type silicon during drying

✍ Scribed by Belmont, O.; Bellet, D.; BreÌchet, Y.

Book ID: 120005610
Publisher: American Institute of Physics
Year: 1996
Tongue: English
Weight: 625 KB
Volume: 79
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.362415

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