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Study of the CdTe/As/Si(111) interface by scanning tunneling microscopy and X-ray photoelectron spectroscopy

✍ Scribed by F. Wiame; S. Rujirawat; G. Brill; Yan Xin; R. Caudano; S. Sivananthan; N.D. Browning; R. Sporken

No coin nor oath required. For personal study only.

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