✦ LIBER ✦

Study of structure and optical properties of silver oxide films by ellipsometry, XRD and XPS methods

✍ Scribed by Xiao-Yong Gao; Song-You Wang; Jing Li; Yu-Xiang Zheng; Rong-Jun Zhang; Peng Zhou; Yue-Mei Yang; Liang-Yao Chen

Book ID: 113936701
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 156 KB
Volume: 455-456
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2003.11.242

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