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Study of structural defects in ZnGeP2 crystals by X-ray topography based on the Borrmann effect

✍ Scribed by Okunev, A. O. ;Verozubova, G. A. ;Trukhanov, E. M. ;Dzjuba, I. V. ;Galtier, P. R. J. ;Said Hassani, S. A.

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📜 SIMILAR VOLUMES

Effect of the defect structure character

✍ Dr. I. G. Novikova 📂 Article 📅 1978 🏛 John Wiley and Sons 🌐 English ⚖ 485 KB 👁 2 views

Investigation of the defects distributio

✍ W. Wierzchowski; K. Wieteska; W. Graeff; E. Wierzbicka; M. Lefeld-Sosnowska; A. 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 478 KB

X-ray methods in the study of defects in

✍ Lang, A. R. 📂 Article 📅 1967 🏛 International Union of Crystallography 🌐 English ⚖ 298 KB

A study of the contrast on growth striat

✍ J. Kuběna; V. Holý 📂 Article 📅 1985 🏛 Springer 🌐 English ⚖ 482 KB

An examination of defects in InP single

✍ K. Naukkarinen; T. Tuomi; V.-M. Airaksinen; K.-M. Laakso; J.A. Lahtinen 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 830 KB

The influence of the spectral asymmetry

✍ Adéla Kochanovská 📂 Article 📅 1959 🏛 Springer 🌐 English ⚖ 393 KB