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Study of SiOx decomposition kinetics and formation of Si nanocrystals in an SiO2 matrix

โœ Scribed by B.J Hinds; F Wang; D.M Wolfe; C.L Hinkle; G Lucovsky


Book ID
117148816
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
129 KB
Volume
227-230
Category
Article
ISSN
0022-3093

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Electron energy loss spectroscopy study
โœ M Takeguchi; K Furuya; K Yoshihara ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 373 KB

It is well known that SiO 2 is decomposed to silicon and oxygen under irradiation by an electron beam. We have discovered that Si nanocrystals can be formed in SiO 2 thin films with a high-intensity convergent electron beam at high temperature. In the present work, we examined the formation process