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Study of Semiconductor Multilayer Structures by Cathodoluminescence and Electron Probe Microanalysis

โœ Scribed by M.V. Zamoryanskaya; Ya.V. Kuznetsova; T.B. Popova; A.A. Shakhmin; D.A. Vinokurov; A.N. Trofimov


Book ID
107456904
Publisher
Springer US
Year
2010
Tongue
English
Weight
232 KB
Volume
39
Category
Article
ISSN
0361-5235

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One of the graphical methods of multivariate data analysis, namely non-linear mapping, is applied to the processing of the results of electron probe x-ray microanalysis of individual aerosol particles. A method of representation of the results of non-linear mapping in the form of triplot is proposed