Study of radiation damage in InGaN and AlGaN films induced by 8.9 MeV Bi33+ ions

✍ Scribed by Zhang, L.M.; Li, C.X.; Zhao, J.T.; Yang, K.J.; Zhang, G.F.; Wang, T.S.; Zhang, C.H.

• Book ID: 121465601
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 734 KB
• Volume: 305
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2013.04.042