Study of polycrystalline-Si thin-film transistors with different channel layer thickness at low bias voltage

✍ Scribed by Miin-Horng Juang; C.W. Chang; J.L. Wang; D.C. Shye; C.C. Hwang; S.L. Jang

• Book ID: 104052510
• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 898 KB
• Volume: 87
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2009.11.015