𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Study of planarization of cobalt silicide lines and silicon surfaces by scanning force microscopy and scanning electron microscopy

✍ Scribed by K. Robrock; K. N. Tu; D. W. Abraham; J. B. Clabes

Book ID
126509758
Publisher
American Institute of Physics
Year
1989
Tongue
English
Weight
562 KB
Volume
54
Category
Article
ISSN
0003-6951

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Reflected Electron Energy-loss Microscop
Reflected Electron Energy-loss Microscopy and Scanning Auger Microscopy Study of Semiconductor Surfaces
✍ Paparazzo, E. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 495 KB πŸ‘ 2 views

The diagnostic potential of reΓ‘ected electron energy-loss microscopy (REELM) and scanning Auger microscopy (SAM) are explored with respect to two particular aspects encountered in the surface microchemical analysis of semiconductor materials : determining the kind of coverage, i.e. whether continuou

A study of hydrogenated carbon fibers by
A study of hydrogenated carbon fibers by scanning electron microscopy and confocal laser scanning microscopy
✍ Antonio MadroΓ±ero De La Cal; Juan Aguado-Serrano; Maria Luisa Rojas-Cervantes; E πŸ“‚ Article πŸ“… 2009 πŸ› John Wiley and Sons 🌐 English βš– 349 KB

## Abstract The hydrogen absorption process is studied in carbonaceous fibers produced from a mixture of methane and hydrogen. The absorption of the hydrogen was examined in two types of fibers, in β€œas‐grown” state and after a process of desorption during an annealing to 1.473 K under vacuum. Later