Study of bulk and surface phonons and pl
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T. Dumelow; A.R. El Gohary; A. Hamilton; K.A. Maslin; T.J. Parker; N. Raj; B. Sa
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Article
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1990
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Elsevier Science
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English
β 367 KB
Measurements" by Raman spectroscopy, oblique incidence far-IR power reflection spectroscopy and attenuated total reflection spectroscopy have been used to study bulk and surface phonons and plasmons in semiconductor superlattices and multiple quantum wells. Raman spectroscopy has been used to invest