Study of Langmuir–Blodgett Layers by a Depth-Sensitive Positron Technique

✍ Scribed by Cs. Szeles; A. Vértes; É. Kiss; S. Szpala; K.G. Lynn

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 89 KB
• Volume: 176
• Category: Article
• ISSN: 0021-9797
• DOI: 10.1006/jcis.1995.9957

✦ Synopsis

lattice imperfections from point defects to surfaces. Their Ferric and magnesium stearate Langmuir-Blodgett films (1) interactions with structural imperfections is a rich, challengdeposited on silica glass were studied by variable-energy positron ing, and rewarding field of study which gives unique inforbeam. Positrons signal the presence of the film even after deposimation on various properties of the defects and disorder. tion of only 3 monolayers. A signal with 3 and 9% higher S parame-With the deepening understanding of these interactions in ter values are characteristic for the ferric and magnesium stearate relatively simple systems and with the steady progress of films, respectively. In addition, positrons were found to be sensitive beam technology the interest of the researchers is shifting to to the chemical structure of the layers. The results suggest that more complex systems such as compound semiconductors, positron beams could be promising probes of the thickness, compooxide superconductors, polymers, organic films, e.t.c. (4, 5).

sition, and adhesion of Langmuir-Blodgett films.