Quantitative trace analysis by non-reson
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S. Hayashi; Y. Hashiguchi; K. Suzuki; T. Ohtsubo; B. J. McIntosh
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Article
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1991
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John Wiley and Sons
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English
โ 539 KB
## Abstract In order to overcome the poor quantitativeness of conventional SIMS, sputtered neutral mass spectrometry (SNMS) employing nonโresonant laser postโresonant laser postโionization has been studied. By studied. By combining a timeโofโflight (TOF) analyzer with a powerful excimer laser, it w