Study of electron traps in the thin interfacial oxide layer of Al-, Au- and Sn-n GaAs Schottky barriers by detrapping experiments: R. L. Van Meirhaeghe, W. H. Laflere and F. Cardon. Solid-St. Electron.25 (11), 1089 (1982)

• Book ID: 107829600
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 126 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91133-2