Study of dynamic grain growth by electron microscopy and EBSD
β Scribed by O.V. ROFMAN; P.S. BATE; I. BROUGH; F.J. HUMPHREYS
- Book ID
- 108866622
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 888 KB
- Volume
- 233
- Category
- Article
- ISSN
- 0022-2720
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Reflection electron microscope studies of surface dynamic processes are reviewed and illustrated with recent new observations. They include: surface electromigration and current dependent structures of Si surfaces; surface etching by oxidation of Si surface; and growth of two dimensional alloyed ads
## Abstract We successfully grew Gallium nitride (GaN) films on MgAl~2~O~4~ (111) substrates using low temperature pulsed laser deposition (PLD). Xβray diffraction rocking curves revealed the high quality of asβgrown GaN with its full width at half maximum (FWHM) along [0002] as small as 0.08Β°. Ato