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Study of deep level defect behavior in undoped n-InP (1 0 0) after rapid thermal annealing

✍ Scribed by V. Janardhanam; A. Ashok Kumar; V. Rajagopal Reddy; Chel Jong Choi

Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 227 KB
Volume: 88
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2010.10.031

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Study of deep level defect behavior in undoped n-InP (1&#xa0;0&#xa0;0) after rapid thermal annealing

Study of deep level defect behavior in undoped n-InP (1 0 0) after rapid thermal annealing