Study of decoration microdefects in lec-grown Si-doped GaAs crystals by selective photoetching and laser scattering tomography

✍ Scribed by J.L. Weyher; P. Gall; G. Frigerio; L. Zanotti

• Book ID: 107790362
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 456 KB
• Volume: 106
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(90)90061-o