✦ LIBER ✦
Complementary DSL, EBIC and PL study of grown-in defects in Si-doped GaAs crystals grown under Ga- and As-rich conditions by LEC method
✍ Scribed by J.L. Weyher; C. Frigeri; P.J. Van der Wel
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 811 KB
- Volume
- 103
- Category
- Article
- ISSN
- 0022-0248
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