Study of a Pure-Ge/Si Short-Period Superlattice by X-Ray Double Crystal Diffraction

✍ Scribed by Zhenguo Ji; Huanming Lu; Shiguo Zhang; Duanlin Que; N. Usami; H. Sunamura; Y. Shiraki

• Book ID: 110412192
• Publisher: Springer
• Year: 1999
• Tongue: English
• Weight: 205 KB
• Volume: 7
• Category: Article
• ISSN: 1573-4870
• DOI: 10.1023/a:1021877415290