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Studies of the composition, ion-induced reduction and preferential sputtering of anodic oxide films on Hg0.8Cd0.2Te by XPS

✍ Scribed by A.B. Christie; I. Sutherland; J.M. Walls

Publisher: Elsevier Science
Year: 1983
Weight: 78 KB
Volume: 135
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(83)90016-6

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