Studies of high DC current induced degradation in III-V nitride based heterojunctions

✍ Scribed by Ho, W.Y.; Surya, C.; Tong, K.Y.; Lu, L.W.; Ge, W.K.

• Book ID: 114538212
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 89 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.848286