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Studies of effect of deposition parameters on the ZnO films prepared by PLD

✍ Scribed by Shuchi Tripathi; R.J. Choudhary; A. Tripathi; V. Baranwa1; A.C. Pandey; J.W. Gerlach; C. Dar; D. Kanjilal


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
608 KB
Volume
266
Category
Article
ISSN
0168-583X

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## Abstract We prepared Co‐doped ZnO films by the electrochemical deposition. X‐ray diffraction (XRD), high resolution transmission microscopy (HRTEM), x‐ray photoelectron spectroscopy (XPS), atomic force microscope (AFM), x‐ray absorption near‐edge structure (XANES), vibrating sample magnetometer