Studies of crystalline defects during the early stages of growth of Si on Si(100) at low temperatures by spot profile analysis of LEED (SPA-LEED)

✍ Scribed by J. Falta; M. Henzler

• Book ID: 118365591
• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 674 KB
• Volume: 269-270
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(92)91221-v