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Structure of ultra-thin silicon film on HOPG studied by polarization-dependence of X-ray absorption fine structure

✍ Scribed by Baba, Y.; Shimoyama, I.; Hirao, N.; Sekiguchi, T.


Book ID
123067018
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
508 KB
Volume
594
Category
Article
ISSN
0009-2614

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