Structure of thin aluminium-oxide films determined from valence band spectra measured using XPS

✍ Scribed by P.C Snijders; L.P.H Jeurgens; W.G Sloof

• Book ID: 117216269
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 429 KB
• Volume: 496
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/s0039-6028(01)01591-6