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Structure of thin aluminium-oxide films determined from valence band spectra measured using XPS

โœ Scribed by P.C Snijders; L.P.H Jeurgens; W.G Sloof


Book ID
117216269
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
429 KB
Volume
496
Category
Article
ISSN
0039-6028

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