Structure and spectroscopic characterization of polycrystalline vanadyl phthalocyanine (VOPc) films fabricated by vacuum deposition
โ Scribed by Y.L. Pan; Y.J. Wu; L.B. Chen; Y.Y. Zhao; Y.H. Shen; F.M. Li; S.Y. Shen; D.H. Huang
- Publisher
- Springer
- Year
- 1998
- Tongue
- English
- Weight
- 168 KB
- Volume
- 66
- Category
- Article
- ISSN
- 1432-0630
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a
## Abstract Twoโsource thermal evaporation technique was used to prepare Hg~x~Cd~1โx~Te thin films onto scratch free transparent glass substrates. The structural investigations revealed that thin films were polycrystalline in nature. Transmittance measurements in the wavelength range (500โ2700 nm)