Structure and characterization of the dislocations in tilt grain boundaries between Σ = 1 and Σ = 3; a high resolution electron microscopy study

In-situ transmission electron microscopy

In-situ transmission electron microscopy study of glissile grain boundary dislocation relaxation in a near Σ = 3 {1 1 1} grain boundary in copper

✍ J.P. Couzinié; B. Décamps; L. Boulanger; L. Priester 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 293 KB

An in-situ annealing experiment has been performed on an intergranular dislocation configuration composed only of glissile grain boundary dislocations observed in a near Σ = 3 {1 1 1} grain boundary in copper. Relaxation phenomena are not obvious than those predicted by theoretical models. Upon anne