Structural visualization of polarization fatigue in epitaxial ferroelectric oxide devices

✍ Scribed by Do, Dal-Hyun; Evans, Paul G.; Isaacs, Eric D.; Kim, Dong Min; Eom, Chang Beom; Dufresne, Eric M.

• Book ID: 109933447
• Publisher: Nature Publishing Group
• Year: 2004
• Tongue: English
• Weight: 394 KB
• Volume: 3
• Category: Article
• ISSN: 1476-1122
• DOI: 10.1038/nmat1122