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Structural study on optical recording materials Ge2Sb2+xTe5 and GeBi2Te4

✍ Scribed by Shin-ichi Shamoto; Noboru Yamada; Toshiyuki Matsunaga; Thomas Proffen

Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
239 KB
Volume
385-386
Category
Article
ISSN
0921-4526

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✦ Synopsis

Crystal structures of optical recording materials Ge 2 Sb 2+x Te 5 and GeBi 2 Te 4 have been studied in terms of the fast phase transition mechanism by both real-and reciprocal-space Rietveld analyses of pulsed neutron powder diffraction data. These crystalline phases had large local lattice distortions. In addition, the crystallite size of GeBi 2 Te 4 was very small (about 150 A ˚). These results suggest that the similarity of entropy between crystalline and amorphous phases plays an important role in terms of the fast phase transition mechanism.

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## Abstract Optical absorption spectra of post‐annealed Ge~2~Sb~2~Te~5~ films were measured in the photon energy range from 0.5 to 3.5 eV. Optical absorption edge and Urbach slope parameter changed slightly with increase in annealing temperature and then abrupt changes occurred at around crystalliz