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Structural, optical and microscopic properties of chemically deposited Mo0.5W0.5Se2thin films

โœ Scribed by P. P. Hankare; A. H. Manikshete; D. J. Sathe; P. A. Chate

Publisher
Springer US
Year
2009
Tongue
English
Weight
321 KB
Volume
21
Category
Article
ISSN
0957-4522

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The structural, electrical and optical properties of AgGa(Se 0.5 S 0.5 ) 2 thin films deposited by using the thermal evaporation method have been investigated as a function of annealing in the temperature range of 450-600 ยฐC. X-ray diffraction (XRD) analysis showed that the structural transformation