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Structural, optical and electrical measurements on boron-doped CdO thin films

✍ Scribed by A. A. Dakhel


Publisher
Springer
Year
2011
Tongue
English
Weight
440 KB
Volume
46
Category
Article
ISSN
0022-2461

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## Abstract A series of lightly Tl‐doped CdO thin films (1%, 1.5%, 2%, 2.5%, and 3%) have been prepared by a vacuum evaporation method on glass and Si wafer substrates. The prepared films were subjected to structural study by X‐ray diffraction, optical characterisation by UV–VIS–NIR absorption spec