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Structural, morphological, optical and photoluminescence properties of HfO2 thin films

โœ Scribed by Ma, C.Y.; Wang, W.J.; Wang, J.; Miao, C.Y.; Li, S.L.; Zhang, Q.Y.


Book ID
122685213
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
962 KB
Volume
545
Category
Article
ISSN
0040-6090

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Structure and optical properties of HfO2
โœ Tingting Tan; Zhengtang Liu; Hongcheng Lu; Wenting Liu; Hao Tian ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 231 KB

HfO 2 thin films have been deposited on Si substrate by radio frequency reactive magnetron sputtering. The optical and structural properties of HfO 2 thin films in relation to rapid thermal annealing (RTA) temperatures are investigated by spectroscopic ellipsometry (SE), X-ray diffraction (XRD) and