Structure and optical properties of HfO2
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Tingting Tan; Zhengtang Liu; Hongcheng Lu; Wenting Liu; Hao Tian
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Article
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2010
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Elsevier Science
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English
โ 231 KB
HfO 2 thin films have been deposited on Si substrate by radio frequency reactive magnetron sputtering. The optical and structural properties of HfO 2 thin films in relation to rapid thermal annealing (RTA) temperatures are investigated by spectroscopic ellipsometry (SE), X-ray diffraction (XRD) and