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Structural matching of line drawings using the geometric relationship between line segments

✍ Scribed by Takashi Matsuyama; Hidekazu Arita; Makoto Nagao


Publisher
Elsevier Science
Year
1984
Weight
89 KB
Volume
25
Category
Article
ISSN
0734-189X

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## Abstract The relationship between the coupling ratio and the time delay is analyzed using the FDTD method. The FDTD method for analyzing a microstrip structure with two lines is represented. An RVS (resistive voltage source) with single‐point excitation and a PML with eight layers are chosen for