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Numerical analysis of the relationship between the coupling ratio and the time delay along microstrip lines using the FDTD method

✍ Scribed by Yongjin Kim; Sangseol Lee


Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
169 KB
Volume
31
Category
Article
ISSN
0895-2477

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✦ Synopsis


Abstract

The relationship between the coupling ratio and the time delay is analyzed using the FDTD method. The FDTD method for analyzing a microstrip structure with two lines is represented. An RVS (resistive voltage source) with single‐point excitation and a PML with eight layers are chosen for the FDTD method. For the various parameters of a microstrip structure, the relationships between the coupling ratio and time delay are numerically analyzed. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 31: 256–260, 2001.