Structural Defects and Degradation Phenomena in High-Power Pure-Blue InGaN-Based Laser Diodes

✍ Scribed by Tomiya, S.; Goto, O.; Ikeda, M.

• Book ID: 114565193
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 539 KB
• Volume: 98
• Category: Article
• ISSN: 0018-9219
• DOI: 10.1109/jproc.2009.2032306