Analysis of the Role of Current, Temperature, and Optical Power in the Degradation of InGaN-Based Laser Diodes

✍ Scribed by Meneghini, M.; Trivellin, N.; Orita, K.; Yuri, M.; Ueda, D.; Zanoni, E.; Meneghesso, G.

• Book ID: 114619304
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 264 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.2010602