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Structural Characterization of Y2Pd14B5

โœ Scribed by D.W. Hough; U. Jaenicke-Roessler; G. Zahn; A. Belger; A. Guembel; C.-G. Oertel; W. Skrotzki


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
403 KB
Volume
35
Category
Article
ISSN
0232-1300

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Structural Characterization of Pd-doped
โœ Cao, Xiaoping; Cao, Lili; Yao, Wenqing; Ye, Xiaoyan ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 415 KB ๐Ÿ‘ 2 views

100084, P. R. China In this paper, the structures of Pd-doped SnO, thin films prepared by a Sol-Gel technique are characterized by x-ray photoelectron spectroscopy, scanning Auger microscopy, x-ray diffraction and differential thermal analysis plus thermogravimetric analysis. It is observed that fil