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Structural characterization of thin films based on II–VI ternary compounds deposited by evaporation

✍ Scribed by G. Gordillo; E. Romero

Book ID
108287822
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
213 KB
Volume
484
Category
Article
ISSN
0040-6090

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✍ Yamaguchi, T. ;Hatori, M. ;Niiyama, S. ;Miyake, Y. 📂 Article 📅 2006 🏛 John Wiley and Sons 🌐 English ⚖ 239 KB

## Abstract Cu(In,Ga) (S,Se)~2~ thin films were fabricated by sequential evaporation from CuGaSe~2~, CuInSe~2~ and In~2~S~3~ compounds for photovoltaic device applications. From XRF analysis, the Cu:(In + Ga):(S + Se) atomic ratio in all thin films was approximately 1:1:2. As the [In~2~S~3~]/([CuGa