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Structural characterization of sputter-deposited Ba0.48Sr0.52TiO3/LaNiO3 artificial superlattice structure by X-ray reflectivity and diffraction

✍ Scribed by Hsin-Yi Lee; Kun-Fu Wu; Heng-Jui Liu; Chih-Hao Lee; Yuan-Chang Liang

No coin nor oath required. For personal study only.

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