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Structural characterization of La0.9Ba0.1MnO3/Y-ZrO2 film by X-ray diffraction

✍ Scribed by W.S. Tan; H.O. Wang; P. Dai; H.P. Wu; X.S. Wu; Q.J. Jia; G.J. Hu; J. Gao

No coin nor oath required. For personal study only.

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